Raster rotation, dynamic focus, image improvement function, Data input (point-to-point measurement, angle measurement, texts),preset magnification, Stage positioning navigation function (SEM MAP), beam marking function Optical axis adjustment: auto (current alignment)Īuto brightness and contrast control (ABCC) Secondary electron detector, sensitive semiconductor backscattered electron detector Pre-centered cartridge type tungsten hairpin filament ×7 to ×800,000 (magnification of actual display*2) High-quality data acquisition is faster than ever!ģ.0 nm (accelerating voltage 30 kV, WD＝5 mm, high vacuum mode)ġ5.0 nm (accelerating voltage 1 kV, WD＝5 mm, high vacuum mode)Ĥ.0 nm (accelerating voltage 30 kV, WD＝5 mm, low vacuum mode) Thanks to the high-speed auto functions based on new design algorithms, the time to execute auto image-adjustment functions is 3X shorter as compared with the previous model. Easily navigate the entire observable area (compared with the Hitachi Model S-3700N)Īfter sample setting is complete, various image adjustments (AFS/ABCC/AFC/ASC) are automated, so that sample images can be acquired immediately after starting observation.■Automatic Functions for Operators of Any Skill Level Simultaneous display for different signal types.Ability to control stage navigation and observation conditions via mouse.2.Evolution of the Market-Improved Automatic Functions for Operators of Any Skill Level ■Multiple Modes of Operationįeatures a graphical user interface offering easy operation and flexibility by:
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